Scanning Tunneling Microscope |
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Constant Current |
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Constant Height |
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AFM General |
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Photosensor |
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Overview approach/scanning |
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Pull-off / Pull-on |
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Waterlayer on surface |
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Additional modes in AFM |
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Lateral mode |
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AC - mode |
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Tapping mode, phasecontrast |
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Nanointendation |
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Artefacts in AFM |
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Sharp tip |
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Blunt tip |
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Bunt tip 2 |
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Broken tip |
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lateral mode |
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XPS, Auger, Fluorescence, UPS spectroscopy |
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spectroscopy |
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